Are you ready to dive deep into the world of advanced measurement techniques? Measuring By Light 2025 is thrilled to announce an engaging Microsystems Workshop, hosted by Dr. Peter Steeneken (TU Delft) and Dr. Gerard Verbiest (TU Delft), that will explore the latest advancements in modal analysis, focusing on thin membranes and MEMS characterization.

Workshop Agenda:

• [30 min] General Introduction: We’ll start with a foundational overview of modal analysis and its significance in modern research.
• [30 min] Measuring Thin (Graphene) Membranes: Dive into cutting-edge research papers on mode shape imaging and the reconstruction of stress distributions in thin membranes, including microphone characterization.
• [30 min] MEMS Characterization: Gain practical insights into MEMS characterization, featuring valuable contributions from an industry expert to provide real-world perspectives.
• [60 min] Live DEMO of MEMS with Polytec Vibrometer: Experience a live demonstration using the Polytec vibrometer, including collaboration opportunities to use your own system during this exciting showcase.

📍 Location: Aula Conference Centre, Delft, NL
🕒 Date & Time: April 2, 2025, during the Measuring By Light conference
💼 Who Should Attend: Researchers, engineers, and anyone interested in cutting-edge measurement techniques and Microsystems.

Don’t miss this opportunity to enhance your skills and connect with fellow professionals.

Together, we’ll explore the first step towards mastering modal analysis and MEMS characterization. We will update you on the registration process in March 2025.

Join us and transform your understanding of measurement technologies!